kulondola kwa granite kuti muwunikenso FPD

Pakupanga mawonekedwe a flat panel (FPD), kuyesa kuti muwone momwe mapanelo amagwirira ntchito ndi mayeso kuti awone momwe amapangira amachitidwa.

Kuyesedwa pa nthawi ya ndondomeko

Kuti muyese ntchito ya gulu mu ndondomeko yowonongeka, kuyesa kwamagulu kumachitidwa pogwiritsa ntchito tester array, probe probe ndi probe unit.Mayesowa adapangidwa kuti ayese magwiridwe antchito a mabwalo amtundu wa TFT omwe amapangidwira mapanelo pamagalasi agalasi ndikuwona mawaya osweka kapena akabudula.

Panthawi imodzimodziyo, pofuna kuyesa ndondomekoyi kuti muwone bwino momwe ndondomekoyi ikuyendera komanso ndemanga zomwe zachitika kale, choyesa cha DC parameter tester, TEG probe ndi probe unit amagwiritsidwa ntchito pa mayeso a TEG.(“TEG” imayimira Test Element Group, kuphatikiza ma TFTs, ma capacitive element, ma waya, ndi zinthu zina zamagawo osiyanasiyana.)

Kuyesa mu Unit/Module Process
Pofuna kuyesa ntchito yamagulu mu selo ndi ndondomeko ya module, mayesero owunikira anachitidwa.
Gululi limayatsidwa ndikuwunikiridwa kuti liwonetse mawonekedwe oyeserera kuti ayang'ane magwiridwe antchito, zolakwika za mfundo, zolakwika za mzere, chromaticity, chromatic aberration (yosagwirizana), kusiyanitsa, ndi zina.
Pali njira ziwiri zowunikira: kuyang'anira mawonekedwe a opareshoni ndi kuyang'ana pawokha pogwiritsa ntchito kamera ya CCD yomwe imangozindikira zolakwika ndikuyesa kulephera / kulephera.
Ma cell testers, cell probes and probe units amagwiritsidwa ntchito pounika.
Mayeso a module amagwiritsanso ntchito njira yodziwira mura ndi malipiro omwe amangozindikira mura kapena kusagwirizana pawonetsero ndikuchotsa mura ndi malipiro oyendetsedwa ndi kuwala.